TTTC's Electronic
Broadcasting Service
|
1st IEEE International
Workshop on Automotive Reliability & Test |
CALL FOR
PARTICIPATION
|
|
The ART workshop focuses exclusively on test and reliability of automotive and mission-critical electronics, including design, manufacturing, burn-in, system-level integration and in-field test, diagnosis and repair solutions, as well as architectures and methods for reliable and safe operations under different environmental conditions. With increasing system complexity, security, stringent runtime requirements for functional safety and cost constraints of a mass market the reliable operation of electronics in safety-critical domains is still a major challenge. The ART Workshop offers a forum to present and discuss these challenges and emerging solutions among researchers and practitioners alike. |
|
The full program is available on the workshop’s website: http://ART.tttc-events.org. If you are attending ITC don’t miss the event. |
|
| |
Additional Information | |
Yervant Zorian – General Chair Synopsys 690 East Middlefield Road Mountain View, CA 94043-4033, USA Tel.: +1 (650) 584-7120 E-mail: zorian@synopsys.com
H.-J. Wunderlich – Program Chair University of Stuttgart Pfaffenwaldring 47 D-70569 Stuttgart, Germany Tel.: +49 (0)711 685 88 391 E-mail: wu@informatik.uni-stuttgart.de |
|
Committee | |
Organizing Committee: General Chair: Y. Zorian, Synopsys Vice Chair: D. Appello, ST Micro Program Chair: H.-J. Wunderlich, University of Stuttgart Vice Program Chair: M. Sonza Reorda, Polito Torino Special Session Chair: R. Parekhji, Texas Instruments Panel: P. Sarson, AMS Finance: S. Natarajan, Intel Publication: L. Anghel, TIMA Laboratory Publicity: P. Bernardi, Polito Torino Registration: T. McLaurin, ARM
Program Committee: (to include) C. Argyrides, AMD R. Arnold, Infineon O. Ballan, Xilinx N. Bishnoi, Globalfoundries O. Bringmann, University of Tuebingen A. Cron, Synopsys W. Dobbelaere, ON Semiconductor P. Engelke, Infineon G. Ernst, Bosch C. Eychenne, Bosch G. Georgakos, Infineon D. Gizopoulos, University of Athens M. Glaß, University of Erlangen A. Hales, Texas Instruments P. Harrod, ARM W. Kunz, University of Kaiserslautern A. Majumdar, Xilinx R. Mariani, Intel S. Mehta, Synopsys R. Montino, Elmos Semiconductor N. Mukherjee, Mentor Graphics M. Nicolaidis, TIMA Laboratory H.-C. Reuss, University of Stuttgart A. Sanghani, Intel S. Sarangi, nVidia S. Schmerler, Daimler AG R. van Rijsinge, NXP P. van Staa, Bosch H. M. von Staudt, Dialog Semiconductor R. Wagner, Bosch M. Wahl, University of Siegen |
|
For more
information, visit us on the web at: ART.tttc-events.org
|
|
The 1st IEEE International Workshop on Automotive Reliability & Test is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC). |
|
||
IEEE
Computer Society- Test Technology Technical
Council
|
||
TTTC
CHAIR PAST
CHAIR TTTC 1ST
VICE CHAIR SECRETARY ITC
GENERAL CHAIR TEST WEEK
COORDINATOR TUTORIALS
AND EDUCATION STANDARDS EUROPE MIDDLE EAST
& AFRICA STANDING
COMMITTEES ELECTRONIC
MEDIA |
PRESIDENT OF
BOARD SENIOR PAST
CHAIR TTTC 2ND
VICE CHAIR FINANCE IEEE DESIGN & TEST EIC TECHNICAL
MEETINGS TECHNICAL
ACTIVITIES ASIA &
PACIFIC LATIN
AMERICA NORTH
AMERICA COMMUNICATIONS INDUSTRY
ADVISORY BOARD |
|
This message contains public information only. You are invited to copy and distribute it further. For more information contact the TTTC office or visit http://tab.computer.org/tttc/ To remove or modify your contact information, or to register new users, please click here and follow the on-line instructions. |